Saturday, 6 May 2017

X-ray imaging and computer modeling help map electric properties of nanomaterials

Researchers have developed a new approach for studying piezoelectric materials using ultrafast 3-D X-ray imaging and computer modeling. Their integrated approach can help us better understand material behavior and engineer more powerful and energy-efficient technologies.

from Engineering and Construction News – ScienceDaily https://www.sciencedaily.com/releases/2017/05/170506110755.htm



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